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工業技術研究院

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雷射掃描系統光學畸變校正技術

技術簡介

工研院雷射掃描系統光學畸變校正技術,透過高對比校正片設計,搭配同軸成像光學、大面積打光、人機量測系統與量測誤差結果分析,達到高精度的畸變校正結果。


特色與創新

  • 同軸視覺光路技術。
  • 同軸視覺畸變校正技術。
  • 校正人機量測系統。

規格

  • 雷射應用波段: 355nm/532nm/1064nm。
  • 影像光學倍率: 1X~4X(可客製化設計)。
  • 影像解析度 : ≥ 20 lp/mm@30%。

應用與效益

  • 雷射圖案加工。
  • 金屬模具咬花。
  • 遠端雷射焊接。
  • 雷射雕刻。

雷射掃描系統光學畸變校正技術



延伸閱讀
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