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Instrumentation and Sensing/AOI

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The modules are used on micro-scale optical characteristics measurement on the manufacturing progress of display including the processes of glass, TFT Array, CF, LC, module, and system.
The Center for Measurement Standards has developed varieties of automatic inspection module/system/equipment to meet the inspection requirements of LED/PV industries, including the Production line measurement of PV.
The Center for Measurement Standards has developed varieties of Automatic Inspection Module/System/Equipment in order to meet the requirements of precision machine industry in the inspection of machined parts.
The Center for Measurement Standards has developed varieties of automatic inspection module/equipment to meet the requirements of Semiconductor industry in inspection.
The Center for Measurement Standards developed micro scale non-contact optical 3D micro structure measurement technology for material inspection. Multiple measurement modules have been set up.
The Center has established multiple measurement modules that integrated with optics, mechanism, and software, including AOI module, off-line/in-line AOI machine, etc.
Multiple measurement modules have been set up by the Center that integrated with optics, mechanism, and software, including AOI module, off-line/in-line AOI machine, etc.
The Center for Measurement Standards developed high-precision optical measurement technology for shaft related devices of precision machine industry.
The Center for Measurement Standards developed multi-spectral characteristic inspection technology for optical devices.
The Center for Measurement Standards developed multi- or polarized light inspection technology for optical devices, including AOI inspection detector or module, off-line/in-line AOI machine, etc.