工業技術研究院

技術簡介

一種偵測太陽能電池中的熱斑區域的方法，包括：施加第一電壓方波於太陽能電池，第一電壓方波包括間隔式的多個逆偏電壓段以及接續在該些逆偏電壓段之後的至少一第一正偏電壓段，於至少一第一正偏電壓段擷取太陽能電池的第一近紅外光影像；施加第二電壓方波於太陽能電池，第二電壓方波包括至少一第二正偏電壓段，於至少一第二正偏電壓段擷取太陽能電池的第二近紅外光影像；以及依據第一近紅外光影像與第二近紅外光影像的至少一影像差值來獲取太陽能電池的至少一熱斑區域。

Abstract

A method for detecting hot spot region in a solar cell, including applying a first voltage square wave to the solar cell, the first voltage square wave includes a plurality of spaced reverse bias voltage segments and at least one first forward bias voltage segment following the reverse bias voltage segments, capturing a first near-infrared light image of the solar cell at the at least one first forward bias voltage segment, applying a second voltage square wave to the solar cell, the second voltage square wave includes at least one second forward bias voltage segment, capturing a second near-infrared light image of the solar cell at the at least one second forward bias voltage segment, and obtaining at least one hot spot region of the solar cell according to at least one image difference between the first near-infrared light image and the second near-infrared light image.

技術規格

擷取EL影像作相減後，可得影像差值運算的強度隨時間的變化，當施加偏壓(-5 V, t1=t2=1 sec)於樣品60 sec時，EL影像差值~300 counts/s對應熱像儀的34.4 ℃，120 sec時的EL影像差值~400 counts/s對應熱像儀的38.8 ℃，差值訊號越強顯示該區溫度越高。

Technical Specification

After subtracting Electroluminescence (EL) images, the intensity of the image difference calculation changes over time. When a bias of -5 V (t1=t2=1 sec) is applied to the sample for 60 seconds, the EL image difference is approximately 300 counts/s, corresponding to 34.4 ℃ on the thermal imager. At 120 seconds, the EL image difference increases to about 400 counts/s, corresponding to 38.8 ℃ on the thermal imager. A stronger difference signal indicates a higher temperature in that area.

技術特色

對矽晶電池施加一周期性電壓方波，此方波需具有正逆偏壓，逆偏壓段的電流會引起電池低並聯電阻(Rshunt)缺陷區的升溫，正偏壓段則會讓矽晶電池發出近紅外光波段的電致發光訊號(electroluminescence, EL)，使用光偵測器(charge-coupled device, CCD)擷取每個或最末個正偏壓段的實驗組EL影像。待矽晶電池溫度降低至環境溫度後，再對矽晶電池施加另一週期性電壓方波，該方波條件為將前述方波的逆偏段電壓設為0，光偵測器擷取每個或最末個正偏壓段的對照組EL影像。將實驗組EL影像扣減對照組EL影像後，會顯現出矽晶電池中的熱效應影響區。

應用範圍

太陽光電相關產業

接受技術者具備基礎建議（設備）

太陽光電模組檢測及相關製程設備廠

接受技術者具備基礎建議（專業）

具備半導體、光電、能源及材料等相關經驗的研發人員與銷售業務

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