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工業技術研究院

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技術名稱: 高解析電子能量損失光譜分析技術

技術簡介

本計畫目標在於發展高時效性、超高空間與能量解析電子損失能譜,以提供研究組樣品化學定量組成及進行分子鍵結分析,加速研究及先進檢測之能量。

Abstract

This technique highlights the achievements in analytic TEM, focusing on high throughput elemental analysis in atomic scale using high energy resolution electron energy loss spectrum (EELS).

技術規格

高時效電子損失能譜分析能力≧300 sps; 能量解析能力?0.4 eV。

Technical Specification

high speed EELS spectrums≧300 sps; energy resolution ?0.4 eV.

技術特色

技術為所有化學檢測分析中最高空間解析之檢測方法,並可提供樣品化學鍵結組成、分子軌域分布,及提供樣品性質顯像等高階檢測能力。

應用範圍

高階IC元件檢測,機能性軟物質商品

接受技術者具備基礎建議(設備)

電子顯微鏡基礎原理與相關操作經驗

接受技術者具備基礎建議(專業)

材料、物理、工科相關科系

技術分類 材料分析

聯絡資訊

聯絡人:羅聖全 前瞻材料基磐技術組

電話:+886-3-5915296 或 Email:alexsclo@itri.org.tw

客服專線:+886-800-45-8899

傳真:+886-3-5910086

[{"text":"企業網","weight":13.0},{"text":"材化所","weight":11.5},{"text":"機械所","weight":10.0},{"text":"綠能所","weight":9.4},{"text":"生醫所","weight":8.0},{"text":"半導體","weight":6.2},{"text":"南分院","weight":5.0},{"text":"太陽能","weight":5.0},{"text":"課程","weight":5.0},{"text":"遠紅外線","weight":5.0},{"text":"雷射","weight":4.0},{"text":"LED","weight":4.0},{"text":"LED可見光","weight":3.0},{"text":"5G","weight":3.0},{"text":"工研人","weight":3.0},{"text":"電光所","weight":3.0},{"text":"綠能與環境研究所","weight":3.0},{"text":"機械","weight":3.0},{"text":"資通所","weight":2.0},{"text":"面板","weight":2.0},{"text":"文字轉語音","weight":2.0},{"text":"實習","weight":2.0},{"text":"無人機","weight":2.0},{"text":"生醫","weight":2.0},{"text":"3D","weight":2.0},{"text":"v2x","weight":2.0},{"text":"員工","weight":2.0},{"text":"地圖","weight":2.0},{"text":"太陽光電","weight":2.0},{"text":"材料與化工研究所","weight":1.0}]