『您的瀏覽器不支援JavaScript功能,若網頁功能無法正常使用時,請開啟瀏覽器JavaScript狀態』

跳到主要內容區塊

工業技術研究院

:::

技術名稱: 新興三維記憶體測試與可靠性技術

技術簡介

建立高效能的可測試性設計,以期使用低的測試時間達到高的瑕疵涵蓋率與定位能力。

Abstract

none

技術規格

read disturb and data retention mechanism for 1D1R cell endurance failure mechanism for 1D1R cell (Degradation of unit cell in 10K cycles)

Technical Specification

none

技術特色

本提案中的固態記憶體測試技術主要用於電阻式記憶體良率之提升,因此,將和電阻式記憶體的市場同步發展,增加產品的競爭力。

應用範圍

半導體設計公司、IDM或記憶體製造廠商

接受技術者具備基礎建議(設備)

須具半導體使用之量測機台操作能力

接受技術者具備基礎建議(專業)

須具半導體製造能力,或相關應用之設計能力。

技術分類 奈米科技

聯絡資訊

聯絡人:張順賢 奈米電子技術組

電話:+886-3-5913917 或 Email:shchang@itri.org.tw

客服專線:+886-800-45-8899

傳真:+886-3-5917690

[{"text":"企業網","weight":13.0},{"text":"材化所","weight":11.5},{"text":"機械所","weight":10.0},{"text":"綠能所","weight":9.4},{"text":"生醫所","weight":8.0},{"text":"半導體","weight":6.2},{"text":"南分院","weight":5.0},{"text":"太陽能","weight":5.0},{"text":"課程","weight":5.0},{"text":"遠紅外線","weight":5.0},{"text":"雷射","weight":4.0},{"text":"LED","weight":4.0},{"text":"LED可見光","weight":3.0},{"text":"5G","weight":3.0},{"text":"工研人","weight":3.0},{"text":"電光所","weight":3.0},{"text":"綠能與環境研究所","weight":3.0},{"text":"機械","weight":3.0},{"text":"資通所","weight":2.0},{"text":"面板","weight":2.0},{"text":"文字轉語音","weight":2.0},{"text":"實習","weight":2.0},{"text":"無人機","weight":2.0},{"text":"生醫","weight":2.0},{"text":"3D","weight":2.0},{"text":"v2x","weight":2.0},{"text":"員工","weight":2.0},{"text":"地圖","weight":2.0},{"text":"太陽光電","weight":2.0},{"text":"材料與化工研究所","weight":1.0}]