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工業技術研究院

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技術名稱: 高速光譜量測關鍵模組技術

技術簡介

在光譜量測關鍵模組技術,我們布局了微型光譜技術、面型彩色分析儀技術、高光譜影像儀技術,應用在工業檢測應用和民生檢測應用。 1. 微型光譜儀技術運用在半導體LED晶粒檢測,我們發展顯高光通量光學系統,搭配消干涉元件鍍膜技術同時增強UV光,取樣時間可以達到0.1ms,適合高亮度LED產線上量測使用。 2. 面型彩色分析儀技術運用在面板及LED成品量測,我們發展了最佳化彩色濾光片設計技術,能夠達到±3%輝度準確度和<0.0035色度準確度,並且能製作29M高解析度架構,適合運用在大面積發光體線上量測。 3. 高光譜儀量測技術運用在民生應用,我們發展了多層膜干涉濾鏡架構量測二維影像光譜資訊,以及線型掃描量測架構,能夠運用在手持式民生食物辨識和碳水化合物含量分析。

Abstract

1.For LED wafer chip industry, we develop high optical throughput and interference elimination micro spectrometer. The integration time achieves 0.1ms for high brightness in-line measurement. 2.For LED productions, we develop 2D colorimeter. Using optimized filter designed algorithm, the luminance accuracy is ±3% and color coordinate accuracy is <0.0035. The 2D colorimeter can be applied in the active and the passive luminous productions. 3.For commercial industry, we develop the mobile hyper spectrum technology. Using stack interference filter and line scan measurement technology, the food identification and qualified carbohydrates can be achieved.4.For intelligent manufacturing industry, we develop the leading high sensitive organic CMOS image sensor. We have the fabrication design technology to achieve high optical throughput (60 degree receiving angle) and high UV sensitivity. This sensor can be applied in industrial modules and industrial system.

技術規格

1. 微型光譜儀技術: 波長範圍 380~780 nm,量測速度: 0.1ms,波長解析度: <2nm 2. 面型彩色分析儀技術: resolution up to 29Mpixels 3. 高光譜儀技術: wavelength range: 400-780 nm; wavelength resolution: 15~20 nm; Sensing area 20x20 cm^2

Technical Specification

1. Micro Spectrumeter: wavelength range: 380~780 nm,integrating time: 0.1ms,wavelength resolution: <2nm 2. 2D colorimeter: resolution up to 29Megapixels 3. Hyperspectral Technology: wavelength range: 400-780 nm; wavelength resolution: 15~20 nm; Sensing area 20x20 cm^2

技術特色

同技術簡介

應用範圍

1.微型光譜儀。 2.半導體、顯示器產線光譜特性量測設備。 3.民生手持式食物與成分之光譜分析裝置。 4.高靈敏度CMOS影像感測器。

接受技術者具備基礎建議(設備)

1. 標準校正光源 2. 鍍膜相關設備

接受技術者具備基礎建議(專業)

1. 薄膜製程背景 2. Lens Design背景 3. FPGA設計背景 4. 類比電路設計背景

技術分類 先進檢測與感測儀器- 檢測/設備技術

聯絡資訊

聯絡人:劉志祥 量測技術發展中心

電話:+886-3-5732038 或 Email:ChihShangLiu@itri.org.tw

客服專線:+886-800-45-8899

傳真:none

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