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工業技術研究院

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技術名稱: 二維及三維積層製造量測技術

技術簡介

可提高解析的2D+3D量測架構及演算法,即使在解析不足的情況下,亦可透過方法來增加量測解析度,除了可以監控二維形狀及三維高度變化外,亦可針對二維粉材鋪粉狀態進行量測,確保量測前後的品質變化。

Abstract

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技術規格

(1)量測範圍:250*250mm (2)量測解析<100um

Technical Specification

none

技術特色

可提高解析的2D+3D量測架構及演算法,即使在解析不足的情況下,亦可透過方法來增加量測解析度,除了可以監控二維形狀及三維高度變化外,亦可針對二維粉材鋪粉狀態進行量測,確保量測前後的品質變化。

應用範圍

積層製造、雷射燒結

接受技術者具備基礎建議(設備)

投光取像模組

接受技術者具備基礎建議(專業)

光學相關背景

技術分類 先進檢測與感測儀器- 檢測/設備技術

聯絡資訊

聯絡人:卓嘉弘 量測技術發展中心

電話:+886-3-5743817 或 Email:Gabo_Cho@itri.org.tw

客服專線:+886-800-45-8899

傳真:none

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