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工業技術研究院

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技術名稱: 外觀缺陷光學檢測模組設計技術

技術簡介

本計畫中目標是標示出鳳梨外觀列目缺陷,檢測時鳳梨旋轉360度取像,1秒約取5-6張影像,同時可以看6顆鳳梨,並標示出裂目缺陷。技術內容涵蓋:取像、打光硬體,及取像與傳輸系統搭配設計,更包括影像處理演算法。演算法涵蓋:前處理技術、去背、目標物標定及缺陷找出演算法

Abstract

The goal in this project is to measure the size of the pineapples. In our pineapple grader, the pineapple rotates 360 degrees in the conveyer. And the images were taken. It takes about 5-6 photos in 1 second. At the same time, you can see 6 pineapples at the same time and define the position of the pineapples. Algorithm includes: automatic defect labeling, image preprocessing, targets labeling and deep learning for defect.

技術規格

1.自動labling技術 2.影像前處理技術 3.缺陷深度學習

Technical Specification

1.automatic labling alogrithm 2.image preprocess alogrithm 3.Deep learning of defects

技術特色

由鳳梨切入再導入其它水果,如:鳳梨釋迦,或其它漁產

應用範圍

不同種類水果,如: 鳳梨釋迦;或是其它產業,如:漁業蝦類病變;或是工業工業產品瑕疵

接受技術者具備基礎建議(設備)

接受技術者具備基礎建議(專業)

軟體及光學

技術分類 先進檢測與感測儀器- 檢測/設備技術

聯絡資訊

聯絡人:林雁容 儀器與感測技術發展組

電話:+886-3-5732287 或 Email:linyr@itri.org.tw

客服專線:+886-800-45-8899

傳真:

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